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Уведомление об обновлениях схем

Change Notification #   16353
Revision  
Type of Notification   FINAL PRODUCT/PROCESS CHANGE NOTIFICATION
Change Title   Qualification of Aizu, Japan Fab to Source NMOS Die in ON Semiconductor Over-Voltage Protection Devices.
Issue Date   2009-10-23
Affected Product Family  
Description   ON Semiconductor is pleased to issue this final process change notice announcing the qualification of the ON Semiconductor wafer fabrication facility in Aizu, Japan as a source for the NMOS FET die used in the Over-Voltage Protection family of devices. This qualification was originally announced in Initial PCN #16249. Upon expiration of this Final PCN, both the existing wafer foundry and the ON Semiconductor Aizu, Japan facility will be qualified sources for this NMOS FET die.
Key Items Affected by Change   ON Semiconductor Wafer Fab Site
 
Key Milestones  
Effective Date:   2009-01-23
Sample Info:   Contact your local ON Semiconductor Sales Office
Possible Replacements   N/A

For more information on this Process Change Notification, please contact your local ON Semiconductor sales office.

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